Is it possible to determine if a QPA1015L GaN transistor is undamaged with a multimeter?

My QPA1015L is imbedded in an amplifier circuit. It has recently started drawing down the magnitude of Vg_pinchoff at -6.4v, and Vg_biasON at -2.8v, to Vgs = -0.64v. Ig is 5.7mA, which is causing this reduction in Vgs due to a drop in the gate current limiting resistor, and the input impedance measured with an ohmmeter on the de-embedded QPA reads around Rgs = 14ohms. A fresh new unused unit measures ~500kohm Rgs. Is my low 14 ohm measurement an indication that this unit has failed? Is the ohmeter a safe and valid test? in the old days we used curve tracers to verify biased transistor operation, but I haven’t seen one of these in many years. what is the correct way to test a GaN FET? David M